| Details of the Publication | |||
| Paper Code | |||
| Title | A superior interfacial reliability of Fe-Ni UBM during high temperature storage | ||
| Authors | Gao, Li-Yin; Li, Cai-Fu; Wan, Peng; Liu, Zhi-Quan | ||
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| Title of Journal | JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS | ||
| Year | 2017 | ||
| Volume | 28 | ||
| Number | 12 | ||
| Page | 8537-8545 | ||
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