| Details of the Publication | |||
| Paper Code | |||
| Title | Unveiling the pinning behavior of charged domain walls in BiFeO3 thin films via vacancy defects | ||
| Authors | Geng W R,Tian X H, Jiang Y X, Zhu Y L, Tang Y L, Wang Y J, Zou M J,Feng Y P,Wu B,Hu W T,Ma X L. | ||
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| Title of Journal | Acta Materialia | ||
| Year | 2020 | ||
| Volume | 186 | ||
| Number | |||
| Page | 68-76 | ||
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